Measurement of Electro-optic Coefficients

LPS has state of the art facilities, both room temperature and cryogenic temperatures, for accurately determining EO coefficients in thin polymer films and has developed refined analysis techniques.

 

Experimental setup for attenuated total reflection (ATR) measurements

Experimental setup for variable angle reflective measurements


Rigorous Teng-Man Method


“Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures,” D. H. Park, C. H. Lee, and W. N. Herman, Optics Express 14, 8866(2006).

“Advances and pitfalls in reflective electro-optic coefficient measurements,” W.N. Herman, D.H. Park, and C.H. Lee, invited Tutorial at ACS/OSA Organic Thin Films for Photonics Applications Conference, September, 2006, San Francisco.

“Caveats in Reflective EO Measurements and Comparison with ATR,” W. N. Herman and D. H. Park, invited talk at the 10th International Conference on Organic Nonlinear Optics (ICONO10), May 2008, Sante Fe.

“Cryogenic Optical Characterization of Nonlinear Polymers,” D. Park, V. Yun, X. Zhou, J. Luo, A. K.-Y. Jen, and W.N. Herman, presented at CLEO, San Jose, May 2010.